Scanning Electron Microscopy and X Ray Microanalysis - Joseph Goldstein - Books - Springer-Verlag New York Inc. - 9781461349693 - May 31, 2013
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Scanning Electron Microscopy and X Ray Microanalysis 3rd ed. 2003. Softcover reprint of the original 3r edition

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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.


709 pages, biography

Media Books     Book
Released May 31, 2013
ISBN13 9781461349693
Publishers Springer-Verlag New York Inc.
Pages 689
Dimensions 255 × 182 × 43 mm   ·   1.22 kg
Language English  

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