Self-Checking and Fault-Tolerant Digital Design - The Morgan Kaufmann Series in Computer Architecture and Design - Lala, Parag K. (North Carolina Agricultural and Technical State University) - Books - Elsevier Science & Technology - 9780124343702 - June 26, 2000
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Self-Checking and Fault-Tolerant Digital Design - The Morgan Kaufmann Series in Computer Architecture and Design

Lala, Parag K. (North Carolina Agricultural and Technical State University)

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Self-Checking and Fault-Tolerant Digital Design - The Morgan Kaufmann Series in Computer Architecture and Design

With VLSI chip transistors getting smaller and smaller, digital systems are more complex than before. This work deals with self-checking design techniques and emphasizes major techniques for hardware fault tolerance. It shows how to design self-checking sequential circuits. It also introduces reliability theory and importance of maintainability.

400 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 26, 2000
ISBN13 9780124343702
Publishers Elsevier Science & Technology
Pages 400
Dimensions 187 × 235 × 18 mm   ·   612 g

See all of Lala, Parag K. (North Carolina Agricultural and Technical State University) ( e.g. Hardcover Book )