Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach - Pradeep Lall - Books - Taylor & Francis Ltd - 9780367400972 - June 19, 2019
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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach 1st edition

Pradeep Lall

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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach 1st edition

This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures.

336 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 19, 2019
ISBN13 9780367400972
Publishers Taylor & Francis Ltd
Pages 336
Dimensions 621 g
Language English  

See all of Pradeep Lall ( e.g. Paperback Book and Hardcover Book )