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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach 1st edition
Pradeep Lall
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach 1st edition
Pradeep Lall
This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures.
336 pages
Media | Books Paperback Book (Book with soft cover and glued back) |
Released | June 19, 2019 |
ISBN13 | 9780367400972 |
Publishers | Taylor & Francis Ltd |
Pages | 336 |
Dimensions | 621 g |
Language | English |
See all of Pradeep Lall ( e.g. Paperback Book and Hardcover Book )