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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics 2nd ed. 2004 edition
Ullrich Pietsch
High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics 2nd ed. 2004 edition
Ullrich Pietsch
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.
428 pages, 389 black & white illustrations, biography
Media | Books Hardcover Book (Book with hard spine and cover) |
Released | August 27, 2004 |
ISBN13 | 9780387400921 |
Publishers | Springer-Verlag New York Inc. |
Pages | 408 |
Dimensions | 155 × 235 × 23 mm · 816 g |
Language | English |
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