Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy - Chim, Wai Kin (National University of Singapore) - Books - John Wiley & Sons Inc - 9780471492405 - December 22, 2000
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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy

Chim, Wai Kin (National University of Singapore)

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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy

Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.

288 pages, Illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 22, 2000
ISBN13 9780471492405
Publishers John Wiley & Sons Inc
Pages 288
Dimensions 160 × 237 × 20 mm   ·   716 g

See all of Chim, Wai Kin (National University of Singapore) ( e.g. Hardcover Book )