Characterization of Semiconductor Materials, Volume 1: Principles and Methods - McGuire, Gary F. (MCNC, Electronic Technologies Division, Research Triangle Park, NC) - Books - William Andrew Publishing - 9780815512004 - December 31, 1989
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Characterization of Semiconductor Materials, Volume 1: Principles and Methods 1st edition

McGuire, Gary F. (MCNC, Electronic Technologies Division, Research Triangle Park, NC)

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Characterization of Semiconductor Materials, Volume 1: Principles and Methods 1st edition

Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.

342 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 31, 1989
ISBN13 9780815512004
Publishers William Andrew Publishing
Pages 342
Dimensions 165 × 243 × 27 mm   ·   739 g
Language English  
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