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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach 1st edition
Pradeep Lall
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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach 1st edition
Pradeep Lall
This book provides a sound scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. guidelines for thermal derating of microelectronic devices.
336 pages, 30 black & white tables
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | April 24, 1997 |
| ISBN13 | 9780849394508 |
| Publishers | Taylor & Francis Inc |
| Pages | 328 |
| Dimensions | 184 × 264 × 23 mm · 794 g |
| Language | English |
See all of Pradeep Lall ( e.g. Paperback Book and Hardcover Book )