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Reliability and Degradation of Iii-v Opt
Osamu Ueda
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Reliability and Degradation of Iii-v Opt
Osamu Ueda
Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems.
372 pages, 1, black & white illustrations
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | September 30, 1996 |
| ISBN13 | 9780890066522 |
| Publishers | Artech House Publishers |
| Pages | 372 |
| Dimensions | 156 × 234 × 22 mm · 648 g |
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