Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing - Kumar, Ch Sateesh (University of Johannesburg, South Africa) - Books - Taylor & Francis Ltd - 9781032375106 - May 4, 2023
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing

Kumar, Ch Sateesh (University of Johannesburg, South Africa)

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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.


191 pages, 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black

Media Books     Hardcover Book   (Book with hard spine and cover)
Released May 4, 2023
ISBN13 9781032375106
Publishers Taylor & Francis Ltd
Pages 130
Dimensions 241 × 161 × 14 mm   ·   346 g

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