Materials Reliability in Microelectronics III: Volume 309 - MRS Proceedings - - Books - Cambridge University Press - 9781107409484 - June 5, 2014
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Materials Reliability in Microelectronics III: Volume 309 - MRS Proceedings

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

514 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 5, 2014
ISBN13 9781107409484
Publishers Cambridge University Press
Pages 514
Dimensions 152 × 229 × 26 mm   ·   812 g   (Weight (estimated))
Language English  
Editor Filter, William F.
Editor Frost, Harold J. (Dartmouth College, New Hampshire)
Editor Ho, Paul S. (University of Texas, Austin)
Editor Rodbell, Kenneth P. (IBM T J Watson Research Center, New York)

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