Testing Static Random Access Memories: Defects, Fault Models and Test Patterns - Frontiers in Electronic Testing - Said Hamdioui - Books - Springer-Verlag New York Inc. - 9781402077524 - March 31, 2004
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Said Hamdioui
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns - Frontiers in Electronic Testing 2004 edition

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Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

221 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released March 31, 2004
ISBN13 9781402077524
Publishers Springer-Verlag New York Inc.
Pages 221
Dimensions 155 × 235 × 14 mm   ·   526 g
Language English  

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