Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science - Hisham Haddara - Books - Springer-Verlag New York Inc. - 9781461285847 - September 26, 2011
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Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1995 edition

Hisham Haddara

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Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1995 edition

The need for more deep and extensive characterization of MOSFET param eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi tive to the properties of its Si - Si0 interface.

232 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 26, 2011
ISBN13 9781461285847
Publishers Springer-Verlag New York Inc.
Pages 232
Dimensions 155 × 235 × 13 mm   ·   358 g
Editor Haddara, Hisham

See all of Hisham Haddara ( e.g. Hardcover Book and Paperback Book )