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Electrothermal Analysis of VLSI Systems Softcover reprint of the original 1st ed. 2000 edition
Yi-Kan Cheng
Electrothermal Analysis of VLSI Systems Softcover reprint of the original 1st ed. 2000 edition
Yi-Kan Cheng
This useful book addresses electrothermal problems in modern VLSI systems. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.
210 pages, 36 black & white illustrations
Media | Books Paperback Book (Book with soft cover and glued back) |
Released | April 20, 2013 |
ISBN13 | 9781475773736 |
Publishers | Springer-Verlag New York Inc. |
Pages | 210 |
Dimensions | 155 × 235 × 13 mm · 340 g |
Language | English |
See all of Yi-Kan Cheng ( e.g. Hardcover Book and Paperback Book )