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Analog IC Reliability in Nanometer CMOS - Analog Circuits and Signal Processing 2013 edition
Elie Maricau
Analog IC Reliability in Nanometer CMOS - Analog Circuits and Signal Processing 2013 edition
Elie Maricau
This book focuses on modeling, simulation and analysis of analog circuit aging. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.
198 pages, 16 black & white tables, biography
Media | Books Paperback Book (Book with soft cover and glued back) |
Released | June 19, 2015 |
ISBN13 | 9781489986306 |
Publishers | Springer-Verlag New York Inc. |
Pages | 198 |
Dimensions | 155 × 235 × 12 mm · 308 g |
See all of Elie Maricau ( e.g. Hardcover Book and Paperback Book )