CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 - MRS Proceedings - - Books - Materials Research Society - 9781605111285 - November 19, 2009
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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 - MRS Proceedings

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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 - MRS Proceedings

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

179 pages, illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 19, 2009
ISBN13 9781605111285
Publishers Materials Research Society
Pages 194
Dimensions 160 × 236 × 14 mm   ·   430 g
Editor Butterbaugh, Jeffery W.
Editor Demkov, Alexander A. (University of Texas, Austin)
Editor Harris, H. Rusty (Texas A & M University)
Editor Rachmady, Willy
Editor Taylor, Bill