Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Materials Characterization and Analysis Collection - Fred Stevie - Books - Momentum Press - 9781606505885 - September 15, 2015
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Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Materials Characterization and Analysis Collection

Fred Stevie

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Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Materials Characterization and Analysis Collection

150 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 15, 2015
ISBN13 9781606505885
Publishers Momentum Press
Pages 150
Dimensions 152 × 229 × 16 mm   ·   390 g
Language English  

See all of Fred Stevie ( e.g. Paperback Book )