Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) - Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland) - Books - Imperial College Press - 9781783265282 - May 18, 2015
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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) 2nd edition

Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland)

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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) 2nd edition

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.

350 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released May 18, 2015
ISBN13 9781783265282
Publishers Imperial College Press
Pages 432
Dimensions 160 × 238 × 23 mm   ·   802 g
Language English  

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