Strain And Dislocation Gradients From Diffraction: Spatially-resolved Local Structure And Defects

Jacket Description/Flap: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating. Table of Contents: Preface / Rozaliya I. Barubash, Gene E. Ice -- Editor Biographies -- Chapter 1. Diffraction Analysis of Defects: State of the Art / Rozaliya I. Barabash, Gene E. Ice -- Chapter 2. X-ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source / Wenjun Liu, Gene E. Ice -- Chapter 3. High-Energy Transmission Laue (HETL) Micro-Beam Diffraction / Felix Hofmann, Alexander M. Korsunsky -- Chapter 4. XMAS: A Versatile Tool for Analyzing Synchrotron X-ray Microdiffraction Data / Nobumichi Tamura -- Chapter 5. Laue Microdiffraction at the ESRF / Odile Robach, Christoph Kirchlechner, Jean-SEbastien Micha, Olivier Ulrich, Xavier Biquard, Olivier Geaymond, Olivier Castelnau, Michel Bornert, Johann Petit, Sophie Berveiller, Olivier Sicardy, Julie Villanova, FranCois Rieutord -- Chapter 6. 3D X-Ray Diffraction Microscopy / Henning Friis Poulsen, SOren Schmidt, Dorte Juul Jensen, Henning Osholm SOrensen, Erik Mejdal Lauridsen, Ulrik Lund Olsen, Wolfgang Ludwig, Andrew King, Jonathan Paul Wright, Gavin B. M. Vaughan -- Chapter 7. Grain Centre Mapping - 3DXRD Measurements of Average Grain Characteristic / Jette Oddershede, SOren Schmidt, Allan Lyckegaard, Erik Mejdal Lauridsen, Jonathan Paul Wright, Grethe Winther -- Chapter 8. Three-Dimensional X-ray Diffraction (3DXRD) Imaging Techniques / Wolfgang Ludwig, Andrew King, PEter Reischig -- Chapter 9. High-Resolution Reciprocal Space Mapping for Characterizing Deformation Structures / Wolfgang Pantleon, Christian Wejdemann, Bo Jakobsen, Henning Friis Poulsen, Ulrich Lienert -- Chapter 10. Reconstructing 2D and 3D X-ray Orientation Maps from White-Beam Laue / Jonathan Z. Tischler -- Chapter 11. Energy-Variable X-ray Diffraction for Studying Polycrystalline Materials with High Depth Resolution / Emil Zolotoyabko -- Chapter 12. Micrestructure Detail Extraction via EBSD: An Overview / David Fullwood, Brent Adams, Jay Basinger, Timothy Ruggles, Ali Khosravani, Caroline Sorensen, Joshua Kacher -- Chapter 13. High-Pressure Studies with Microdiffraction / Wenge Yang -- Author Index -- Subject Index. Publisher Marketing: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.