Trace-Based Post-Silicon Validation for VLSI Circuits - Lecture Notes in Electrical Engineering - Xiao Liu - Books - Springer International Publishing AG - 9783319005324 - June 27, 2013
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Trace-Based Post-Silicon Validation for VLSI Circuits - Lecture Notes in Electrical Engineering 2013 edition

Xiao Liu

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Trace-Based Post-Silicon Validation for VLSI Circuits - Lecture Notes in Electrical Engineering 2013 edition

This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.

136 pages, 21 black & white illustrations, 38 colour illustrations, 18 black & white tables, biograp

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 27, 2013
ISBN13 9783319005324
Publishers Springer International Publishing AG
Pages 108
Dimensions 155 × 235 × 15 mm   ·   317 g
Language French  
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