Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors - SpringerBriefs in Physics - Seongil Im - Books - Springer - 9789400763913 - May 7, 2013
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Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors - SpringerBriefs in Physics 2013 edition

Seongil Im

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Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors - SpringerBriefs in Physics 2013 edition

Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics.


125 pages, 61 black & white illustrations, 2 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released May 7, 2013
ISBN13 9789400763913
Publishers Springer
Pages 101
Dimensions 155 × 235 × 6 mm   ·   172 g