Fundamentals Of Atomic Force Microscopy - Part I: Foundations - Lessons from Nanoscience: A Lecture Notes Series - Reifenberger, Ronald G (Purdue Univ, Usa) - Books - World Scientific Publishing Co Pte Ltd - 9789814630351 - November 12, 2015
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Fundamentals Of Atomic Force Microscopy - Part I: Foundations - Lessons from Nanoscience: A Lecture Notes Series

Reifenberger, Ronald G (Purdue Univ, Usa)

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Fundamentals Of Atomic Force Microscopy - Part I: Foundations - Lessons from Nanoscience: A Lecture Notes Series

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution.

350 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 12, 2015
ISBN13 9789814630351
Publishers World Scientific Publishing Co Pte Ltd
Pages 340
Dimensions 229 × 155 × 19 mm   ·   492 g

See all of Reifenberger, Ronald G (Purdue Univ, Usa) ( e.g. Hardcover Book and Paperback Book )