Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing - Frans P. M. Beenker - Books - Kluwer Academic Publishers - 9780792396581 - November 30, 1995
In case cover and title do not match, the title is correct

Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing 1995 edition

Frans P. M. Beenker

Price
₪ 687
excl. VAT

Ordered from remote warehouse

Expected delivery May 13 - 26

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing 1995 edition

Considering the testability aspects for digital ICs, this book integrates the testability aspects into the design and manufacturing of ICs and, for each IC design project, gives a precise definition of the boundary conditions, responsibilities, interfaces and communications between persons, and quality targets.

212 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 30, 1995
ISBN13 9780792396581
Publishers Kluwer Academic Publishers
Pages 212
Dimensions 170 × 244 × 14 mm   ·   498 g
Language English  

See all of Frans P. M. Beenker ( e.g. Hardcover Book and Paperback Book )