Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing - Frans P. M. Beenker - Books - Springer-Verlag New York Inc. - 9781461360049 - October 4, 2012
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Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing Softcover Reprint of the Original 1st Ed. 1995 edition

Frans P. M. Beenker

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Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing Softcover Reprint of the Original 1st Ed. 1995 edition

221 pages, black & white illustrations, bibliography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 4, 2012
ISBN13 9781461360049
Publishers Springer-Verlag New York Inc.
Pages 212
Dimensions 155 × 235 × 12 mm   ·   326 g

See all of Frans P. M. Beenker ( e.g. Hardcover Book and Paperback Book )