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Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems 2012 edition
Tomi Laurila
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems 2012 edition
Tomi Laurila
This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.
240 pages, 113 black & white illustrations, 15 colour illustrations, biography
Media | Books Hardcover Book (Book with hard spine and cover) |
Released | January 13, 2012 |
ISBN13 | 9781447124696 |
Publishers | Springer London Ltd |
Pages | 218 |
Dimensions | 155 × 235 × 18 mm · 453 g |
Language | English |
See all of Tomi Laurila ( e.g. Hardcover Book and Paperback Book )