Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems - Tomi Laurila - Books - Springer London Ltd - 9781447160687 - February 22, 2014
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Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems 2012 edition

Tomi Laurila

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Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems 2012 edition

This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.

218 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 22, 2014
ISBN13 9781447160687
Publishers Springer London Ltd
Pages 218
Dimensions 155 × 235 × 15 mm   ·   317 g
Language English  

See all of Tomi Laurila ( e.g. Hardcover Book and Paperback Book )