Hierarchical Modeling for Vlsi Circuit Testing - the Springer International Series in Engineering and Computer Science - Debashis Bhattacharya - Books - Springer-Verlag New York Inc. - 9781461288190 - September 26, 2011
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Debashis Bhattacharya
Hierarchical Modeling for Vlsi Circuit Testing - the Springer International Series in Engineering and Computer Science Softcover Reprint of the Original 1st Ed. 1990 edition

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160 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 26, 2011
ISBN13 9781461288190
Publishers Springer-Verlag New York Inc.
Pages 160
Dimensions 155 × 235 × 10 mm   ·   254 g
Language English  

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