Hierarchical Modeling for Vlsi Circuit Testing - the Springer International Series in Engineering and Computer Science - Debashis Bhattacharya - Books - Springer-Verlag New York Inc. - 9781461288190 - September 26, 2011
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Hierarchical Modeling for Vlsi Circuit Testing - the Springer International Series in Engineering and Computer Science Softcover Reprint of the Original 1st Ed. 1990 edition

Debashis Bhattacharya

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Hierarchical Modeling for Vlsi Circuit Testing - the Springer International Series in Engineering and Computer Science Softcover Reprint of the Original 1st Ed. 1990 edition

160 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 26, 2011
ISBN13 9781461288190
Publishers Springer-Verlag New York Inc.
Pages 160
Dimensions 155 × 235 × 10 mm   ·   254 g
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